Bentonite clay from Patagonia (SEM image)

Contacts for booking
XRD. G. Grathoff.
Tel. ++49(0)3834 86 4584. E-mail:
SEM/TEM. M. Zander.
Tel. ++49(0)3834 86 4581. E-mail:
FIB-SEM. G. Grathoff.
Tel. ++49(0)3834 86 4584. E-mail:
General enquires. L.N. Warr.
Tel. ++49(0)3834 86 4578. E-mail:
General enquires. R. Martens.
Secretary. Tel. ++49(0)3834 86 4570. E-mail:



Mineralogical Laboratories
Institut für Geographie und Geologie
Ernst Moritz Arndt Universität Greifswald
F.L. Jahnstr. 17a
D-17487 Greifswald

Our claylab houses a series of high resolution tools for studying the crystal-chemistry of fine-grained materials. Our prime techniques involve combining X-ray diffraction, and electron microscopy (scanning and transmission modes) for characterizing and monitoring fine particle mineral reactions in various geological and geotechnical settings. A summary of our analytical instruments is listed as follows:

Bruker D5000 X-ray diffractometer (with x 40 sample changer)
Bruker D8 Advance X-ray diffractometer with reaction chambers
JEOL JIB high resolution transmission electron microscope (HRTEM)
JEOL Scanning electron microscope (SEM)
Zeiss Auriga Crossbeam microscope (FIB-SEM) coming in March 2011
Differential thermal analyses (TG-DTA)

HRTEM image of a deformed chlorite crystal lattice from the Alpine Fault, NZ


X-ray diffraction

Bruker D8 Advance X-ray diffractometer equipped with
Humidity chamber
High temperature reaction chamber
Wet-cell XRD cells

Bruker D5000 X-ray diffractometer
x40 sample changer
Cu radiation tube


High-resolution transmission electron microscopy

High resolution transmission electron microscope
Oxford instruments EDX (30mm2 SiLi detector)
Selective electron diffraction analyses
Gatan CCD camera system


Preparation facilities

Eppendorf centrifuge 5810 R


Heraeus flow through centrifuge 17RS

Scanning electron microscopy

JEOL JXA 840A Scanning electron microscope

Secondary electron detector
EDX analyses
Oxford Instruments cryotransfer system


Differential thermal analyses (TG-DTA)

Thermoanalysesystem SETARAM TGA 92 (TG, DTA, DSC)
upto 1600 °C
air and inert gas


Focused ion beam - electron microscopy (crossbeam)

Zeiss Auriga Crossbeam microscope

Secondary electron detector
EsB backscatter electron detector
EBSD Oxford instruments detector
INCA EDX analyses (with 80mm2 Oxford instruments detector)